-
vc project of ssim, a video quality measurement
vc project of ssim, a video quality measurement
- 2022-06-19 22:20:54下载
- 积分:1
-
KLT feature extraction and tracking
KLT feature extraction and tracking
- 2022-05-19 22:37:06下载
- 积分:1
-
as it is obvious this Solution manual for DigitalCommunications book 4th Edition
as it is obvious this Solution manual for DigitalCommunications book 4th Edition
- 2022-03-03 11:33:35下载
- 积分:1
-
排板王算法的分析与研究
排板王算法的分析与研究
-Pai Wang algorithm plate Analysis and Research
- 2023-06-04 16:20:03下载
- 积分:1
-
this patch can be used for delepmnet projects base on arm
this patch can be used for delepmnet projects base on arm
- 2023-08-21 20:25:04下载
- 积分:1
-
空调不制冷的全部原因.doc空调不制冷的全部原因空调不制冷的全部原因...
空调不制冷的全部原因.doc空调不制冷的全部原因空调不制冷的全部原因-Air conditioning refrigeration not only reasons. Doc is not air-conditioning refrigeration air conditioning all the reasons not all of the reasons for refrigeration
- 2022-01-24 14:04:00下载
- 积分:1
-
主要内容:
潮流计算的数学模型及解算方法
潮流方程的特殊解法
潮流计算中的特殊问题
潮流计算问题的扩展...
主要内容:
潮流计算的数学模型及解算方法
潮流方程的特殊解法
潮流计算中的特殊问题
潮流计算问题的扩展
-main elements : the trend of a mathematical model and solution methods of the special power flow equations flow calculation method to the special problems of the power flow calculation expansion
- 2022-03-24 11:11:54下载
- 积分:1
-
现代先进微处理器有非常高的集成度和复杂度,又有寄存器堆、Cache等嵌入式部件,而且芯片管脚数相对较少,必须要有一定的自测试设计和其它的可测试性设计来简化测试代...
现代先进微处理器有非常高的集成度和复杂度,又有寄存器堆、Cache等嵌入式部件,而且芯片管脚数相对较少,必须要有一定的自测试设计和其它的可测试性设计来简化测试代码,提高故障覆盖率。本文简要讨论NRS4000微处理器芯片的以边界扫描测试为主体,以自测试为补充的可测试性设计框架。着重介绍芯片的边界扫描设计和芯片中译码控制器PLA和微程序ROM以及采用内嵌RAM结构的指令Cache和寄存器堆的内建自测试设计。仿真结果表明,这些可测试性设计大大缩短了测试代码的长度。-modern microprocessors have a very high degree of integration and complexity, there Register pile, Cache such as embedded components, but Chip few relatively small, There must be the self-test design and testing of other design code to simplify testing, fault coverage. This paper briefly discussed Key words microprocessor chip to the boundary-scan test as the mainstay, Since the test to add to the test design framework. Highlighting the boundary-scan chip design and chip decoder PLA and micro-controller procedures and the use of embedded ROM RA M structure of the instruction cache and register stack of built-in self-test design. The simulation results show that these tests can greatly shorten the design of the test code length.
- 2022-04-01 18:08:40下载
- 积分:1
-
PCB库存封装缩写说明: PCB库存封装缩写说明
PCB库存封装缩写说明: PCB库存封装缩写说明 -PCB inventory package abbreviation Description: PCB inventory package abbreviation Description
- 2022-02-12 19:00:25下载
- 积分:1
-
Understanding Import tables in PE WIn32 files
Understanding Import tables in PE WIn32 files
- 2023-07-08 06:05:03下载
- 积分:1